Vista normal
Vista MARC
Electronics and Microelectronics, Instrumentation. (Término temático)
Machine generated authority record.
Work cat.: (UQROO)52654: Singhee, Amith. editor. 62633, Extreme Statistics in Nanoscale Memory Design
Machine generated authority record.
Work cat.: (UQROO)52654: Singhee, Amith. editor. 62633, Extreme Statistics in Nanoscale Memory Design