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Atomic Force Microscopy Based Nanorobotics [electronic resource] : Modelling, Simulation, Setup Building and Experiments / by Hui Xie, Cagdas Onal, StȨphane RȨgnier, Metin Sitti.

Por: Xie, Hui [author.]Colaborador(es): Onal, Cagdas [author.] | RȨgnier, StȨphane [author.] | Sitti, Metin [author.]Tipo de material: TextoTextoSeries Springer Tracts in Advanced Robotics, 71Editor: Berlin, Heidelberg : Springer Berlin Heidelberg, 2012Descripción: XIV, 344 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783642203299Trabajos contenidos: SpringerLink (Online service)Tema(s): Engineering | Artificial intelligence | Engineering | Robotics and Automation | Artificial Intelligence (incl. Robotics) | Nanotechnology and MicroengineeringFormatos físicos adicionales: Sin títuloClasificación CDD: 629.892 Clasificación LoC:TJ210.2-211.495T59.5Recursos en línea: de clik aquí para ver el libro electrónico
Contenidos:
Springer eBooksResumen: The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.
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Descriptions and challenges of AFM based nanorobotic systems -- Instrumentation issues of an AFM based nanorobotic system -- Nanomechanics of AFM based nanomanipulation -- Teleoperation based AFM manipulation control -- Automated control of AFM based nanomanipulation -- Applications of AFM based nanorobotic systems.

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

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