Interfacial Compatibility in Microelectronics [electronic resource] : Moving Away from the Trial and Error Approach / by Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Krȵckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti.

Por: Laurila, Tomi [author.]Colaborador(es): Vuorinen, Vesa [author.] | Paulasto-Krȵckel, Mervi [author.] | Turunen, Markus [author.] | Mattila, Toni T [author.] | Kivilahti, Jorma [author.]Tipo de material: TextoTextoSeries MicrosystemsEditor: London : Springer London, 2012Descripción: X, 218 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9781447124702Trabajos contenidos: SpringerLink (Online service)Tema(s): Engineering | Optical materials | Surfaces (Physics) | Engineering | Nanotechnology and Microengineering | Surfaces and Interfaces, Thin Films | Optical and Electronic MaterialsFormatos físicos adicionales: Sin títuloClasificación CDD: 620.5 Clasificación LoC:T174.7Recursos en línea: de clik aquí para ver el libro electrónico
Contenidos:
Springer eBooksResumen: Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the ǣtraditionalǥ method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced. In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes: solutions to several common reliability issues in microsystem technology, methods to understand and predict failure mechanisms at interfaces between dissimilar materials and an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA. Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.
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Introduction: Away from trial and error methods -- Materials and interfaces in Microsystems -- Introduction to mechanics of materials -- Introduction to thermodynamic-kinetic method -- Interfacial adhesion in polymer systems -- Evolution of different types of interfacial structures.

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the ǣtraditionalǥ method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced. In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes: solutions to several common reliability issues in microsystem technology, methods to understand and predict failure mechanisms at interfaces between dissimilar materials and an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA. Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.

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