Atomic Scale Interconnection Machines [electronic resource] : Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011 / edited by Christian Joachim.
Tipo de material:
Multi-probe UHV machine instrumentation -- Nano-material nanowires charaterisation -- Surface conductance measurements -- Surface atomic scale machineries (transistor, logic gate, mechanics) -- Industrial applications.
This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, spantopics such as:multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements andsurface atomic scale mechanical machineries. This state-of-the-art accountallows academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.
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