Pattern Recognition and Image Analysis [electronic resource] : 6th Iberian Conference, IbPRIA 2013, Funchal, Madeira, Portugal, June 5-7, 2013. Proceedings / edited by Joo M. Sanches, Luisa Mic, Jaime S. Cardoso.

Por: Sanches, Joo M [editor.]Colaborador(es): Mic, Luisa [editor.] | Cardoso, Jaime S [editor.]Tipo de material: TextoTextoSeries Lecture Notes in Computer Science, 7887Editor: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013Descripción: XX, 900 p. 396 illus. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783642386282Trabajos contenidos: SpringerLink (Online service)Tema(s): Computer science | Artificial intelligence | Text processing (Computer science | Computer vision | Computer graphics | Optical pattern recognition | Computer Science | Pattern Recognition | Computer Imaging, Vision, Pattern Recognition and Graphics | Image Processing and Computer Vision | Document Preparation and Text Processing | Computer Graphics | Artificial Intelligence (incl. Robotics)Formatos físicos adicionales: Sin títuloClasificación CDD: 006.4 Clasificación LoC:Q337.5TK7882.P3Recursos en línea: de clik aquí para ver el libro electrónico
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Springer eBooksResumen: This book constitutes the refereed proceedings of the 6th Iberian Conference on Pattern Recognition and Image Analysis, IbPRIA 2013, held in Funchal, Madeira, Portugal, in June 2013. The 105 papers (37 oral and 68 poster ones) presented were carefully reviewed and selected from 181 submissions. The papers are organized in topical sections on computer vision, pattern recognition, image and signal, applications.
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Computer vision -- Pattern recognition -- Image and signal -- Application.

This book constitutes the refereed proceedings of the 6th Iberian Conference on Pattern Recognition and Image Analysis, IbPRIA 2013, held in Funchal, Madeira, Portugal, in June 2013. The 105 papers (37 oral and 68 poster ones) presented were carefully reviewed and selected from 181 submissions. The papers are organized in topical sections on computer vision, pattern recognition, image and signal, applications.

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