Particle Size Measurements [electronic resource] : Fundamentals, Practice, Quality / by Henk G. Merkus.

Por: Merkus, Henk G [author.]Tipo de material: TextoTextoSeries Particle Technology Series, 17Editor: Dordrecht : Springer Netherlands, 2009Descripción: XII, 534 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9781402090165Trabajos contenidos: SpringerLink (Online service)Tema(s): Materials | Weights and measures | Industrial engineering | System safety | Nanotechnology | Surfaces (Physics) | Material Science | Characterization and Evaluation of Materials | Measurement Science, Instrumentation | Nanotechnology | Quality Control, Reliability, Safety and Risk | Industrial and Production EngineeringFormatos físicos adicionales: Sin títuloClasificación CDD: 620.11 Clasificación LoC:TA404.6Recursos en línea: de clik aquí para ver el libro electrónico
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Springer eBooksResumen: Following my graduation in physical organic chemistry at the University of Amst- dam, I started to work at the Royal Dutch Shell Laboratories in Amsterdam. My first assignment was research in the field of detergents and industrial chemicals. It was followed by development work on thermal wax cracking for production of C C 2 14 olefins and on acid-catalyzed synthesis of carboxylic acids from C C olefins. 3 6 Then, I made a significant change to analytical chemistry, first at Shells process development department and later in the chemical engineering department of Delft University of Technology. In both departments, there was a large variety of analy- cal techniques and development of new methods for automated analysis of small process streams. It was the time that gas chromatography conquered the world. In this field, a firm basis was given by Henk Boer, Arie Kwantes and Frits Zuiderweg at Shell Research Laboratories in Amsterdam, both for packed and for capillary c- umns. The potential of gas chromatography was huge and, therefore, also in Delft, its use increased enormously. Moreover, the growth of this technique was facilitated significantly by the rapidly developing electronics industry. It not only led to digital peak integrators and personal computers but also enabled complex measurement techniques. In addition, I became involved in surface area and porosity characteri- tion of catalysts and adsorbents, on which topic the research had been initiated by Prof. J. H. de Boer.
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Particle Size, Size Distributions and Shape -- Quality Aspects in Particulate Analysis -- Sampling of Particulate Material -- Dispersion of Powders in Air and in Liquids -- Overview of Size Characterization Techniques -- Microscopy and Image Analysis -- Sieves and Sieving -- Electrical Sensing Zone -- Laser Diffraction -- Ultrasound Extinction -- Dynamic Light Scattering -- Sedimentation Techniques -- In- and On-Line Measurement -- Written Standards -- Reference Materials -- Quality Management and Calibration -- Definitions and Symbols -- Multilingual Terminology -- Statistical Background.

Following my graduation in physical organic chemistry at the University of Amst- dam, I started to work at the Royal Dutch Shell Laboratories in Amsterdam. My first assignment was research in the field of detergents and industrial chemicals. It was followed by development work on thermal wax cracking for production of C C 2 14 olefins and on acid-catalyzed synthesis of carboxylic acids from C C olefins. 3 6 Then, I made a significant change to analytical chemistry, first at Shells process development department and later in the chemical engineering department of Delft University of Technology. In both departments, there was a large variety of analy- cal techniques and development of new methods for automated analysis of small process streams. It was the time that gas chromatography conquered the world. In this field, a firm basis was given by Henk Boer, Arie Kwantes and Frits Zuiderweg at Shell Research Laboratories in Amsterdam, both for packed and for capillary c- umns. The potential of gas chromatography was huge and, therefore, also in Delft, its use increased enormously. Moreover, the growth of this technique was facilitated significantly by the rapidly developing electronics industry. It not only led to digital peak integrators and personal computers but also enabled complex measurement techniques. In addition, I became involved in surface area and porosity characteri- tion of catalysts and adsorbents, on which topic the research had been initiated by Prof. J. H. de Boer.

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