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Applied Rasch Measurement: A Book of Exemplars [electronic resource] : Papers in Honour of John P. Keeves / edited by Rupert Maclean, Ryo Watanabe, Robyn Baker, Boediono, Yin Cheong Cheng, Wendy Duncan, John Keeves, Zhou Mansheng, Colin Power, J. S. Rajput, Konai Helu Thaman, Sivakumar Alagumalai, David D. Curtis, Njora Hungi. por Maclean, Rupert [editor.] | Watanabe, Ryo [editor.] | Baker, Robyn [editor.] | Boediono [editor.] | Cheng, Yin Cheong [editor.] | Duncan, Wendy [editor.] | Keeves, John [editor.] | Mansheng, Zhou [editor.] | Power, Colin [editor.] | Rajput, J. S [editor.] | Thaman, Konai Helu [editor.] | Alagumalai, Sivakumar [editor.] | Curtis, David D [editor.] | Hungi, Njora [editor.] | SpringerLink (Online service). Origen: Springer eBooksTipo de material: Texto; Formato:
electrónico
disponible en línea ; Forma literaria:
No es ficción Editor: Dordrecht : Springer Netherlands, 2005Acceso en línea: de clik aquí para ver el libro electrónico Disponibilidad: No hay ítems disponibles :
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