000 03841nam a22005655i 4500
003 DE-He213
005 20191011014507.0
007 cr nn 008mamaa
008 100301s2005 xxu| s |||| 0|eng d
020 6 4 _a9780387259031
_9978-0-387-25903-1
024 8 7 _a10.1007/b136458
_2doi
050 8 4 _aTK7888.4
072 8 7 _aTJFC
_2bicssc
072 8 7 _aTEC008010
_2bisacsh
082 _a621.3815
_223
100 8 1 _aDallet, Dominique.
_eauthor.
_913238
245 9 7 _aDynamic Characterisation of Analogue-to-Digital Converters
_h[electronic resource] /
_cby Dominique Dallet, JosȨ Machado Silva.
001 000044654
300 6 4 _aXX, 280 p.
_bonline resource.
490 8 1 _aThe International Series in Engineering and Computer Science, Analog Circuits and Signal Processing,
_x0893-3405 ;
_v860
505 8 0 _aADC Characterisation Based on Sinewave Analysis -- ADC Applications, Architectures and Terminology -- Sinewave Test Setup -- Time-Domain Data Analysis -- Frequency-Domain Data Analysis -- Code Histogram Test -- Comparative Study of ADC Sinewave Test Methods -- Measurement of Additional Parameters -- Jitter Measurement -- Differential Gain and Phase Testing -- Step and Transient Response Measurement -- Hysteresis Measurement.
520 6 4 _aThe Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for systems performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain. Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs dynamic performance behaviour using sinusoidal stimuli. The three classical methods histogram, sine wave fitting, and spectral analysis are thoroughly described, and new approaches are proposed to circumvent some of their limitations. This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.
650 8 0 _aEngineering.
_913239
650 8 0 _aWeights and measures.
_912544
650 8 0 _aEngineering design.
_913240
650 8 0 _aMicrowaves.
_99379
650 8 0 _aElectronics.
_913241
650 8 0 _aSystems engineering.
_913242
650 _aEngineering.
_913239
650 _aCircuits and Systems.
_913243
650 _aElectronic and Computer Engineering.
_98801
650 _aEngineering Design.
_913244
650 _aElectronics and Microelectronics, Instrumentation.
_913245
650 _aMicrowaves, RF and Optical Engineering.
_99383
650 _aMeasurement Science, Instrumentation.
_912547
700 8 1 _aSilva, JosȨ Machado.
_eauthor.
_913246
710 8 2 _aSpringerLink (Online service)
_913247
773 8 0 _tSpringer eBooks
776 _iPrinted edition:
_z9780387259024
830 8 0 _aThe International Series in Engineering and Computer Science, Analog Circuits and Signal Processing,
_x0893-3405 ;
_v860
_913248
856 _uhttp://dx.doi.org/10.1007/b136458
_zde clik aquí para ver el libro electrónico
264 8 1 _aBoston, MA :
_bSpringer US,
_c2005.
336 6 4 _atext
_btxt
_2rdacontent
337 6 4 _acomputer
_bc
_2rdamedia
338 6 4 _aonline resource
_bcr
_2rdacarrier
347 6 4 _atext file
_bPDF
_2rda
516 6 4 _aZDB-2-ENG
999 _c44383
_d44383
942 _c05